First-principles modeling of electrostatics and transport in 2D topological transistors

We develop a simulation framework for electrostatic and transport modeling of 2D Topological insulator field-effect transistor (2D TIFETs), based solely on first-principles calculations using density functional theory (DFT). We find that careful consideration of basis set and symmetry constraints in DFT calculations is crucial for determining critical electric field ($E_c$), defined as the electric field intensity at which the topological phase transition occurs. Using ballistic Landauer-B$ü$ttiker formula and local potential profile, the drain current-gate bias voltage ($I_D$-$V_G$) characteristics were obtained and switching behavior was studied. A comparison with the $\mathbf{k}\cdot\mathbf{p}$ model reveals the necessity of DFT calculations for investigating realistic edge dispersions. Our approach provides an efficient and rigorous simulation methodology for mesoscopic transport in 2D TIFETs.